1. application field

The device is mainly used in the field of semiconductor thermoelectric power generation. It evaluates the power generation performance of thermoelectric elements under different temperature differences, the open-circuit voltage, short-circuit current, internal resistance, and maximum power generation of the elements, and can also evaluate the stability of the elements under use conditions.

2. technical characteristics

(1) A self-designed sample test bench can be used to evaluate single components (P type or N type), and P and N components are symmetrically arranged or arranged on one side for simultaneous testing.

(2) Self-developed software is used to realize heat source temperature control and I-V performance testing, which can evaluate the aging performance of thermoelectric elements under constant temperature thermal persistence and high and low temperature thermal cycling conditions.

3. performance Index

(1) Component size range: 2x2~8x8 mm.

(2) Test temperature: room temperature ~800℃.

(3) Vacuum inert atmosphere.

4. current state

(1) There is currently no relevant commercial equipment in China. This laboratory has built two test equipment. The single test time for a single sample exceeds 5000 hours, and the operation is stable and reliable.

(2) Enterprise standards have been compiled but have not yet been released.